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Support:
Unified Approach
to the Engineering
of Measurement Systems
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Pete Stein’s
Unified Approach to the Engineering
of Measurement Systems
Videotaped lectures with integrated demonstrations.
“The Engineering of Measurement Systems”
“The Dynamics of Measurement Systems”
Two short courses for practicing engineers,
managers, and scientists—in industrial, educational, and governmental
facilities
Equivalent to a 5-credit-hour, 15-week
university course
Bundled with extensive documentation that
includes more than 1000 references keyed to the text
Complete time-based index for each videotape
lists all cited references
62 Hours, 27 VHS Videotapes
NTSC or PAL format
For frequently updated free information about
measurement systems applications, properties, and history, send a blank
e-mail message to
meas-sys@mailback.com,
an auto-responder will reply in minutes. The message features bi-monthly Tid Bits
of information on measurement system applications, properties and history.
Any questions about measurement systems or test design, execution or
applications will gladly be discussed.
Measurement Systems
for test & evaluation featuring the Unified Approach
The Unified Approach to the engineering of
measurement systems, developed by Peter Stein, allows you to understand,
design, interpret, and use measurement systems of all kinds, for all
applications.
It even shows you how to design the
measurement system so as to enable during-the-test proof of its
trustworthiness. More than 300 Programs have taught the Unified Approach
to thousands of engineers in practical, theoretical, and administrative
positions around the world.
The Unified Approach to the engineering of
measurement systems addresses the central concern of data validity ---
that is,
"Can
you prove that these data were produced by this measurement system without
distortion or contamination --- and without affecting the process being
observed?"
The Unified Approach leads to a series of
subsidiary questions and offers the means to answer them.
Given a knowledge of measurement system
characteristics, questions regarding data validity can be answered after a
test is over. Better still if such questions are anticipated beforehand
---
and taken into account when the measurement system is conceived.
Therefore, these courses also teach a method of measurement system design
--- one that even permits during-the-test documentation of answers to the
crucial questions. For an estimate or a quick-look analysis, a measurement
engineer using the Unified Approach can figure the answers literally on
the back of an envelope. We like to say that this approach is
"mathematically sound --- but not mathematically drowned."
The Unified Approach applies to static,
transient, and steady-state dynamic tests, all of which are discussed in
the courses.
The popular Short Courses on The Engineering
& The Dynamics of Measurement Systems for Test & Evaluation, are
now available on 62 full hours of Videotapes recorded during a live
performance at NASA Langley. Based on the Unified Approach developed by
Peter Stein, they include numerous demonstrations, over 1000 references
keyed to the lectures and comprehensive text material. The programs
feature the electrical measurement of mechanical and thermal quantities.
For more information, visit
http://home.earthlink.net/~meas.sys/index.html
For frequently updated free information about
measurement systems applications, properties, and history, send a blank
e-mail message to meas-sys@mailback.com,
Our auto-
responder will reply in minutes. The message features bi-monthly Tid Bits
of information on measurement system applications, properties and history.
Any questions about measurement systems or test design, execution or
applications will gladly be discussed.
Topics
covered in the lectures
The Engineering of
Measurement Systems for Test and Evaluation
- The unified six-terminal transducer model
- System responses to the environment—the 15 noise
levels in every link in the measurement chain
- Noise diagnostics and documentation, including the
three types of check channels
- Signal enhancement and noise suppression—the six
families of noise suppression possibilities
- Common mode problems in electrical, mechanical,
thermal, optical and fluidic systems: a unified approach
- Carrier systems for noise suppression
- Shielding, absorbing or isolating for noise
suppression: mechanical, electrical, and magnetic shields
- The individuality of hardware: key to understanding
transducers
- Data validation—the 17 data validation procedures
- Calibration certificate as “golden calf” (false
security)
- Information as patterns of properties of wave shapes
- Measurement system design and selection: a dozen
performance criteria traded off with a dozen design criteria
- Acoustics as an aid to measurement system validation
- Material properties as they affect transducer design
and performance
- Knowledge-based systems for test data acquisition and
reduction
Applications
- Mechanical, electrical, fluidic, and thermal
measurements in steady state or transient magnetic and thermal
environments
- Measurements when noise levels exceed signal level
and correlate with it in both time and frequency (This includes all
electromagnetic vibration tests and pyroshock, explosion, and impact
- Rotating machinery vibrations
- Systematic vibration test planning
- Thermocouples for steady and transient tests on
surfaces, in solids, and in high-velocity gas streams—the gradient
approach
- Flow measurement: problems and approaches
- Piezoelectric transducers: properties, problems,
applications
- Strain gages as transducer components
The Dynamics of
Measurement Systems for Test and Evaluation
- System linearity as prime criterion for dynamic
measurements
- First second, and higher-order systems: a unified
approach
- Frequency and transient response: concepts,
applications, and compensation (including linearity compensation)
- Laws of measurement system behavior: linearity;
superposition; time relationships; Duhamel and Bush integrals
- Information-reproduction criteria (frequency-content,
wave-shape, and peak-to-peak reproduction; coincidence measurements)
- Information-shaping criteria: integrating and
differentiating
- Data validation for: rise-time (high-frequency)
problems, undershoot (low-frequency) problems, impact-excited
resonance, and sweep speed effects
- Filter design and selection criteria
- Transducer calibration under dynamic conditions
- Transverse or cross sensitivity effects
- Data analysis and correlation procedures
Applications
- Mechanical, electrical, fluidic, and thermal systems
under steady-state and transient excitation
About Pete Stein
Pete Stein holds two B.Sc. degrees and an M.Sc. from M.I.T. in
Cambridge, Massachusetts, where he founded Stein Engineering Services in 1950.
He then served for four years as Group leader, Instrumentation Engineering, at a
small-gas-turbine manufacturer in Phoenix, Arizona. There, he was responsible
for planning measurement systems, selecting transducers and instrumentation,
organizing test procedures, and harvesting provably valid data. Yet he soon
realized that his otherwise excellent education had not prepared him for these
tasks. Consequently he devoted his career to developing his Unified Approach to
the Engineering of Measurement Systems.
Pete was affiliated with universities for 23 years, 14 of them
as full professor of engineering at Arizona State University (ASU). He has been a
visiting professor not only of mechanical engineering (Stanford University), but
also of electrical engineering (Technical University of Braunschweig, Germany),
and of civil engineering (Technical University of Denmark).
He is a Senior Member of IEEE, Fellows of the Instrument
Society of America (ISA) and Fellow of the Society for Experimental Mechanics (SEM)--all
honors awarded to him for developing his Unified Approach to the Engineering of
Measurement Systems.
He is a founding member of the Western Regional Strain Gage
Committee, as well as editor-publisher of the journal Strain Gage Readings,
1956-1964, devoted to experimental stress analysis. He was, for 24 years, a
delegate and board member of the National Conference of Standards Laboratories.
He served on the National Academy of Sciences Evaluation Panels of the National
Bureau of Standards (now NIST) for their Mechanics Division, Electronic
Technology Division, and for the Center of Mechanical Engineering and Process
Technology.
He has received the Frocht Educator Award (From SEM—twice),
the Echman Educator Award (from ISA), the faculty Achievement Award (From ASU),
and SEM’s Tatnall Award for Service to the Society.
To contact Pete Stein:
E-mail to meas.sys@alum.mit.edu
Visit http://home.earthlink.net/~meas.sys/index.html
Phone : 1-800-meas-sys or 480-945-4603
For frequently updated free information about measurement
systems applications, properties, and history, send a blank e-mail
message to meas-sys@mailback.com,
Our auto-responder will reply in minutes. The message features bi-monthly
Tid Bits of information on measurement system applications, properties and
history. Any questions about measurement systems or test design, execution or
applications will gladly be discussed.
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